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Applied logistic regression.

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Dades bibliogràfiques
Autor principal:	Hosmer, David W (autor)
Altres autors:	Lemeshow, Stanley (autor), Sturdivant, Rodney X (autor)
Format:	Llibre
Idioma:	anglès
Publicat:	Hoboken, Estados Unidos: John Wiley and Sons, 2013.
Edició:	3a. edición.
Col·lecció:	Wiley Series in Probability and Statistics.
Matèries:	Regresión lineal Análisis numérico
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!

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