Applied logistic regression.

I tiakina i:
Ngā taipitopito rārangi puna kōrero
Kaituhi matua: Hosmer, David W (autor)
Ētahi atu kaituhi: Lemeshow, Stanley (autor), Sturdivant, Rodney X (autor)
Hōputu: Pukapuka
Reo:Ingarihi
I whakaputaina: Hoboken, Estados Unidos: John Wiley and Sons, 2013.
Putanga:3a. edición.
Rangatū:Wiley Series in Probability and Statistics.
Ngā marau:
Ngā Tūtohu: Tāpirihia he Tūtohu
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!