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Conference on electronic test and measuring instrumentation Testmex 79

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Bibliographic Details
Corporate Author:	Institution of Electrical Engineers (Author)
Format:	Book
Language:	English
Published:	Londres IEE 1979
Series:	IEE Conference Publication, 174
Subjects:	Electrónica Tecnología electrónica MICROELECTRONICA Propagación de ondas Circuitos electrónicos Informática
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