San Martín, C., & Kim, S. (2011). Progress in pattern recognition, image analysis, computer vision, and applications. Springer.
Cita Chicago (17th ed.)San Martín, César, i Sang-Woon Kim. Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications. Berlín: Springer, 2011.
Cita MLA (9th ed.)San Martín, César, i Sang-Woon Kim. Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications. Springer, 2011.
Atenció: Aquestes cites poden no estar 100% correctes.